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Leica DM8000M DM12000M

Leica DM8000M DM12000M

Inspection, process control and defect analysis of wafers or LCDs
and TFTs has to be fast, accurate and ergonomic. Leica Microsystems
has many years of experience in developing inspection
systems for the semiconductor industry. Using this expertise, we
have developed a totally new line of products for the inspection of
8 and 12 inch wafers.
Leica DM8000M DM12000M


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